Boutique Cyber-Physical Analysis

Hardware Analysis

From the electron to the atom: chip-off artifacts extraction, IC decapsulation, and supply chain verification at the silicon level.

OASIS Framework

Anomaly Inspection & Telemetry covers both invisible signals (RF/Thermal) and physical checkpoints (seams, seals, screws, battery terminals) before silicon-level validation.

O

Object

Custody & Serialization

A

Anomaly

RF, Thermal, Seams, Seals & Terminals

S

Silicon

Microscopy & X-Ray

I

Integrity

Golden Base Image + optional 7-year storage

S

Sealed

Attestation Report

Core Capabilities

Silicon-level analysis combining microscopy, chemistry, and electronic analysis

Chip-Off Artifacts Extraction

Extract evidentiary data from destroyed, water-damaged, or non-functional devices by directly accessing storage chips

IC Decapsulation & Die Analysis

Chemical decapsulation of integrated circuits for die inspection, counterfeit detection, and implant discovery

PCB Inspection & Analysis

Technical microscopy up to 5000X magnification for trace analysis, solder joint inspection, and component verification

Hardware Implant Detection

Identify unauthorized modifications, backdoors, or malicious hardware in critical systems

Supply Chain Verification

Authenticate components, detect counterfeits, and verify supply chain integrity for critical systems

Device Reverse Engineering

PCB reverse engineering, firmware extraction, and circuit analysis for security assessments

Real-World Applications

Hardware analysis for high-stakes assessments and security assessments

Evidentiary Extraction from Destroyed Devices

The Scenario

Device physically destroyed or water-damaged, but rigorously sound extraction is critical for legal or intelligence purposes

Our Approach

We perform chip-off extraction by removing storage ICs, creating verified images, and correlating with other digital artifacts

The Outcome

Technical artifacts preserved even when devices won't boot or appear completely destroyed

Counterfeit Component Detection

The Scenario

Critical infrastructure or defense systems suspected of containing counterfeit or tampered components

Our Approach

X-ray inspection, die decapsulation, and comparative analysis against authentic samples to identify counterfeits

The Outcome

Verified authenticity and documented artifacts for supply chain integrity

Hardware Implant Discovery

The Scenario

Suspicion of unauthorized hardware modifications in high-security devices or government equipment

Our Approach

Layer-by-layer inspection using technical microscopy, X-ray, and circuit analysis to identify anomalies

The Outcome

Detection of backdoors, unauthorized modifications, or malicious hardware

Firmware Security Analysis

The Scenario

Unknown firmware or embedded systems requiring security validation before deployment

Our Approach

Firmware extraction, reverse engineering, and vulnerability analysis of embedded systems

The Outcome

Security assessment with detailed findings and remediation recommendations

OASIS Analytical Framework

In-house hardware analysis laboratory with professional-grade equipment for silicon-level analysis and materials verification

Laboratory Equipment & Capabilities

Technical microscopy (40X–5000X magnification) with 4K digital imaging
Chemical decapsulation laboratory with fume hood and safety systems
X-ray and RF spectrum analysis for non-destructive inspection
Soldering station with hot air rework for chip removal and analysis
Oscilloscope and logic analyzer for circuit behavior analysis
Spectroscopy and analytical chemistry for materials verification
Chain-of-custody compliant artifacts handling and documentation

Independent Analysis Capability

All analysis performed in-house without third-party dependencies, ensuring maximum confidentiality and rapid turnaround. Chain-of-custody protocols maintained throughout the analysis process.

Important Note on Admissibility

Hardware analysis results are provided for intelligence and decision-support purposes. While we maintain chain-of-custody protocols and professional standards, our physical analysis capabilities are not currently accredited for direct courtroom admissibility. For litigation-bound artifacts, we can coordinate with accredited laboratories or provide findings as analytical leads. Post-incident analysis follows standard Post-Incident Engineering chain-of-custody protocols.

Ready for Silicon-Level Analysis?

Hardware analysis capabilities are available as part of our boutique retainer services. Limited capacity ensures dedicated attention to each assessment.

Async-first engagement - no calls required.